| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a quality control device capable of quickly extracting a factor that causes a problem from an inspection result of a product and configuration information of components without requiring to acquire characteristic data of each factor such as a member in advance.SOLUTION: A quality control device of the present invention comprises: a result database for storing an inspection result of a product; component retrieval means for retrieving a component of the product related to the inspection result of the product on the basis of the inspection result of the product; information retrieval means for retrieving design and production information related to the retrieved component on the basis of the retrieved component; calculation means for calculating a degree of contribution to a problem for each problem factor on the basis of the inspection result of the product, the retrieved component, and the design and production information; and display means for displaying the problem factor and the calculated degree of contribution that are linked.</p> |
