| 摘要 |
PROBLEM TO BE SOLVED: To decrease the number of relays to be mounted in a probe card.SOLUTION: A semiconductor device includes: a test pad 12a receiving supply of a power supply potential VDD from an outside; a test pad 12b receiving supply of a reference potential VREF0_P from the outside; a test pad 12c receiving supply of a test signal BOP_VTESE activated in a case of entry to a test mode; a VREF0 generation circuit 14 generating a reference potential VREF0 from the power supply potential VDD and outputting the generated reference potential VREF0 to a first node n1; and a VREF0 force circuit 30 including a first switch element provided between the first node n1 and the test pad 12a. The VREF0 force circuit 30 is configured to turn off a first switch element if the test signal BOP_VTESE supplied to the test pad 12c is activated and a potential level of the test pad 12a is a low level. |
