| 发明名称 |
TEST INTERFACE BOARD AND TEST SYSTEM INCLUDING THE SAME |
| 摘要 |
A test interface board includes a substrate including a power plane electrically connected to at least one power terminal of a semiconductor device under test, and a ground plane electrically connected to at least one ground terminal of the semiconductor device under test, and a voltage regulator arranged on the substrate and configured to supply, via the power plane and the ground plane, to the semiconductor device under test, a driving voltage. |
| 申请公布号 |
US2015070041(A1) |
申请公布日期 |
2015.03.12 |
| 申请号 |
US201414458241 |
申请日期 |
2014.08.12 |
| 申请人 |
Samsung Electronics Co., Ltd. |
发明人 |
SONG Ki-Jae;YOO Jong-woon |
| 分类号 |
G01R1/04;G01R31/28;G01R31/26;G01R1/073 |
主分类号 |
G01R1/04 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test interface board, comprising:
a substrate including a power plane electrically connected to at least one power terminal of a semiconductor device under test, and a ground plane electrically connected to at least one ground terminal of the semiconductor device under test; and a voltage regulator arranged on the substrate and configured to supply, via the power plane and the ground plane, to the semiconductor device under test, a driving voltage. |
| 地址 |
Suwon-si KR |
