发明名称 MEMORY DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a memory device including a memory element capable of being operated by a thin film transistor of a low off-state current without problems.SOLUTION: A memory device comprises memory elements being equipped with at least one thin film transistor having an oxide semiconductor layer arranged in a matrix. The thin film transistor having the oxide semiconductor layer is high in field effect mobility and can reduce off-state current, and hence can be favorably operated without problems. In addition, it can reduce power consumption. Such a memory device is effective particularly when, for example, the thin film transistor having the oxide semiconductor layer is disposed in a pixel of a display device, because it can be formed on the same substrate as the memory device.
申请公布号 JP2015046617(A) 申请公布日期 2015.03.12
申请号 JP20140214277 申请日期 2014.10.21
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;TSUBUKI MASASHI;NODA KOSEI;TOYOTAKA KOHEI;WATANABE KAZUNORI;HARADA HIKARI
分类号 H01L21/8242;H01L21/28;H01L21/8244;H01L27/108;H01L27/11;H01L29/786 主分类号 H01L21/8242
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