| 摘要 |
[Problem] To measure the three-dimensional shape of an object to be measured using projection of a one-time pattern light and an imaging operation while minimizing increases in computational costs. [Solution] A three-dimensional shape measurement device (10) in which: pattern light having a plurality of light-dark codes arranged therein is projected onto an object to be measured (20) from a projection device (11); an image of the object to be measured having the pattern light projected thereonto is captured by an imaging device (12); a feature point is extracted by a processing device (13) from the captured image in which an image of the object to be measured is captured; and a three-dimensional position is calculated using position information that is related to the extracted feature point. The three-dimensional shape measurement device (10) is characterized in that: the pattern light comprises either a grid in which a plurality of continuous quadrilaterals having the same shape are arranged or the grid points of the grid; a reference line that is formed by the sides of the quadrilaterals is configured from a pattern having a predetermined angle of inclination with respect to the epipolar plane; and a plurality of feature points are arranged at regular intervals on a straight line that is parallel to the reference line. |
