发明名称 |
Method of removing residual charge, x-ray imaging method and apparatus using the same |
摘要 |
<p>A method of removing residual charge from a photoconductive material includes applying a first voltage to the photoconductive material to form an electrostatic field during a collection operation in which x-rays are irradiated onto the photoconductive material; and applying a second voltage to the photoconductor to reduce an amount of residual charge therein during a removal operation, the second voltage being different from the first voltage. In one or more example embodiments, the photoconductive material may include Mercury Iodine (Hgl 2 ).</p> |
申请公布号 |
EP2846199(A1) |
申请公布日期 |
2015.03.11 |
申请号 |
EP20140183420 |
申请日期 |
2014.09.03 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD |
发明人 |
KIM, YOUNG;KIM, SUNIL;PARK, JAECHUL;LEE, KANGHO |
分类号 |
G03G15/22;H01L27/146 |
主分类号 |
G03G15/22 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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