| 摘要 |
Determining an in-focus position of a plurality of wells in at least a portion of a multi-well plate is done by using a first objective lens having a first magnification to identify, in each of at least three wells of a selected subset of said plurality of wells, an in-focus position of each said well with respect to said first objective lens 302. On the basis of the in-focus positions, computing a plane along which the wells will be in focus with respect to a second objective lens 306 having a second magnification that is not greater than said first magnification; and using said second objective lens to scan, along said plane, at least some of said plurality of wells in said portion of said plate 308. The second objective lens is placed at an appropriate height to be in focus at the required plane. The wells can have non-planar bottom surfaces (22, figure 1b) and an xyz scanner microscope (202, figure 2) and objective exchanger (208, figure 2) may be used. |
