发明名称 半導体装置
摘要 <p>It is an object to provide a semiconductor device which has a large size and operates at high speed. A top gate transistor which includes a semiconductor layer of single-crystal and a bottom gate transistor which includes a semiconductor layer of amorphous silicon (microcrystalline silicon) are formed over the same substrate. Then, gate electrodes of each transistor are formed with the same layer, and source and drain electrodes are also formed with the same layer. Thus, manufacturing steps are reduced. In other words, two types of transistors can be manufactured by adding only a few steps to the manufacturing process of a bottom gate transistor.</p>
申请公布号 JP5684308(B2) 申请公布日期 2015.03.11
申请号 JP20130047801 申请日期 2013.03.11
申请人 发明人
分类号 H01L29/786;G02F1/1343;H01L21/02;H01L21/336;H01L27/12;H01L51/50;H05B33/14 主分类号 H01L29/786
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