发明名称 荷電粒子を検出する検出装置、荷電粒子を検出する方法および質量分析計
摘要 <p>Embodiments of the invention provide a detection apparatus for detecting charged particles having a charged particle detector for receiving and detecting either incoming charged particles or secondary charged particles generated from the incoming charged particles, a photon generator for generating photons in response to receiving at least some of the same incoming charged particles or secondary charged particles generated from the incoming charged particles as are received and detected by the charged particle detector, and a photon detector for detecting photons generated by the photon generator.</p>
申请公布号 JP5684274(B2) 申请公布日期 2015.03.11
申请号 JP20120534655 申请日期 2010.10.18
申请人 发明人
分类号 H01J49/06;G01N27/62;H01J49/40 主分类号 H01J49/06
代理机构 代理人
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