| 摘要 |
<p>A three-dimensional measuring apparatus includes a projecting unit that includes an illumination capable of varying illuminance and that projects a stripe to a measurement object with light from the illumination and shifts a phase of the stripe projected to the measurement object; an imaging unit which captures an image of the measurement object; and a control unit which allows the imaging unit to capture a plurality of the images by allowing the projecting unit to shift the phase of the stripe projected to the measurement object a plurality of times, extracts luminance values from the plurality of captured images, calculates an error rate in three-dimensional measurement of the measurement object based on the extracted luminance values, calculates the error rate for each illuminance by varying the illuminance of the illumination, and determines measurement illuminance for three-dimensionally measuring the measurement object based on the calculated error rate of each illuminance.</p> |
