发明名称 |
Manufacturing apparatus of coordinate detecting device |
摘要 |
A coordinate detecting device includes a resistive film formed on a substrate and a common electrode for applying a voltage to the resistive film, wherein a potential distribution is created in the resistive film, an electric potential of the resistive film at a contact position is detected, and a position of the contact position of the resistive film is detected. In a manufacturing apparatus, a laser light source irradiates laser light to remove a part of the resistive film to form a resistive film removed part, an optical system converges the laser light, a plurality of probes measure electric potentials of a surface of the resistive film with the common electrode providing the voltage to the resistive film, an X-Y table moves the substrate at least two-dimensionally, and a control part controls the X-Y table and the laser light source. |
申请公布号 |
US8975556(B2) |
申请公布日期 |
2015.03.10 |
申请号 |
US200912463458 |
申请日期 |
2009.05.11 |
申请人 |
Fujitsu Component Limited |
发明人 |
Kondoh Koichi |
分类号 |
B23K26/073;G06F3/045;H01C17/242 |
主分类号 |
B23K26/073 |
代理机构 |
IPUSA, PLLC |
代理人 |
IPUSA, PLLC |
主权项 |
1. A manufacturing apparatus of a coordinate detecting device, comprising:
a plurality of probes each provided at a position which comes into contact with a surface of a resistive film that is transparent in a visible region and formed on one surface of a transparent glass substrate of the coordinate detecting device to measure electric potentials of the surface of the resistive film to which a voltage is applied via a common electrode of the coordinate detecting device, wherein said surface of the resistive film faces away from the transparent glass substrate; a laser light source provided at a position facing the other surface of the transparent glass substrate opposite to said one surface, which irradiates laser light toward the resistive film through the transparent glass substrate to remove a part of the resistive film and form a resistive film removed part based on the electric potentials measured with the plurality of probes; an optical system which converges the laser light; an X-Y table which moves the substrate of the coordinate detecting device at least two-dimensionally; and a control part which controls the X-Y table and the laser light source. |
地址 |
Tokyo JP |