发明名称 |
Structured light 3-D measurement module and system for illuminating a subject-under-test in relative linear motion with a fixed-pattern optic |
摘要 |
A surface measurement module for 3-D triangulation-based image acquisition of a subject-under-inspection and under observation by at least one camera. The module having: (a) casing housing an optical system comprising a plurality of lens elements positioned between a fixed-pattern optic and a light source; (b) an output of said fixed-pattern optic comprising a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfy;Inp=Ap+∑k=1KBkpcos(2πfkyp+2πknN)Eq.(1.1)
(c) the subject-under-inspection and fixed-pattern optic in relative linear motion during projection onto the subject-under-inspection of the output of the fixed-pattern optic; and (d) plurality of images captured of this output during projection onto the subject-under-inspection are used for the image acquisition. |
申请公布号 |
US8976367(B2) |
申请公布日期 |
2015.03.10 |
申请号 |
US201113297246 |
申请日期 |
2011.11.15 |
申请人 |
Seikowave, Inc. |
发明人 |
Bellis Matthew W.;Lau Daniel L. |
分类号 |
G01B11/24;G01B11/25;G01N21/956 |
主分类号 |
G01B11/24 |
代理机构 |
Macheledt Bales LLP |
代理人 |
Macheledt Bales LLP |
主权项 |
1. A surface measurement module for 3-D triangulation-based image acquisition of a subject-under-inspection and under observation by at least one camera, the module comprising:
(a) a casing housing an optical system comprising a plurality of lens elements positioned between a fixed-pattern optic and a light source; (b) an output of said fixed-pattern optic comprising a multi-frequency pattern comprising a plurality of pixels representing at least a first and second superimposed sinusoid projected simultaneously, each of the sinusoids represented by the pixels having a unique temporal frequency and each of the pixels projected to satisfyInp=Ap+∑k=1KBkpcos(2πfkyp+2πknN)Eq.(1.1) where Inp is an intensity of a pixel for an nth projected image in a particular moment in time; K is an integer representing a number of component sinusoids, each component sinusoid having a distinct temporal frequency, where K is less than or equal to (N+1)/2, said output comprising at least N projected patterns; a parameter Bkp represents constants that determine an amplitude or signal strength of the component sinusoids; Ap is a scalar; fk is a spatial frequency of a kth sinusoid corresponding to temporal frequency k; and yp represents a spatial coordinate in an image projected as a result of said output; (c) said fixed-pattern optic comprises said multi-frequency pattern fixed into a glass substrate, such that said output thereof results during said projection onto the subject-under-inspection; (d) the subject-under-inspection and said fixed-pattern optic in motion in relative linear motion during projection onto the subject-under-inspection of said output of said fixed-pattern optic; and (e) a plurality of images captured of said output of said fixed-pattern optic during projection onto the subject-under-inspection are used for the image acquisition. |
地址 |
Lexington KY US |