Probe for inspecting electronic component

摘要

A probe for inspecting electronic components, and more particularly, to a probe for inspecting electronic components, which connects a target electronic component to an inspection apparatus to inspect defects of the target electronic component. The probe for inspecting electronic components includes: a cylinder body having a cylindrical shape; a piston body reciprocating between an inside and an outside of the cylinder body; a spring surrounding an outer circumference of the cylinder body and the piston body, and forcing a part of the piston body to resiliently move out of the cylinder body when inserted into the cylinder body; a probing unit extending from the cylinder body to be brought into contact with a target electronic component to be inspected as to flow of electric current therethrough; and a contact unit extending from the piston body to be connected to an inspection apparatus for inspecting the target electronic component.

主权项

1. A probe for inspecting electronic components, the probe comprising:
a cylinder body having a cylindrical shape; a piston body configured to reciprocate between an inside and an outside of the cylinder body; a spring surrounding an outer circumference of the cylinder body and the piston body, and configured to force a part of the piston body to resiliently move out of the cylinder body when the part of the piston body is inserted into the cylinder body; a probing unit extending from the cylinder body, and configured to contact with a target electronic component to be inspected; a contact unit extending from the piston body, and configured to contact with an inspection apparatus which is configured to inspect conduction of electric current of the target electronic component; and a probing body surrounding and holding a probing pin, wherein the probing pin has a unibody structure which includes a hemispherical end portion configured to directly contact with the target electronic component, and an accommodating groove disposed along an outer circumference of the probing pin in a horizontal direction, and wherein the probing body comprises: a securing projection disposed along an inner circumference of the probing body in the horizontal direction, and configured to be accommodated in the accommodating groove.