FIXING DEVICE OF SAMPLE

摘要

The present invention relates to a sample fixing device which can fixate a sample in both a process processing the sample by using a focused ion beam (FIB) with one fixing device, and a process analyzing the processed sample by using transmission electron microscopy (TEM). The sample fixing device according to an embodiment of the present invention comprises: a first holder; and a second holder detachably coupled to the first holder, and where a grid is fixated.