发明名称 Method for calibrating a linearizer and linearized electronic component
摘要 Method for calibrating a linearizer and linearized electronic component the method comprises predistortion, in a predistortion linearizer, of a signal upstream of an electronic component to compensate nonlinear distortion. Determining predistortion setting parameters comprises applying a bifrequency test signal to the component and measuring the relative amplitudes of the lines at the output of the component. A variable indicative of the magnitude |Kp| of the AM/PM conversion coefficient of the component is calculated on the basis of these measurements. The predistortion setting parameters are adjusted so as to minimize |Kp|. The method may in particular be implemented in a linearized amplifier device and in an amplifier test bench.
申请公布号 US8976895(B2) 申请公布日期 2015.03.10
申请号 US201313904216 申请日期 2013.05.29
申请人 Centre National d'Etudes Spatiales 发明人 Sombrin Jacques;Giraud Xavier;Guerin Alexandre;Lesthievent Guy;Millerioux Jean-Pierre;Deplancq Xavier
分类号 H04K1/02;H04L25/03;H04L25/49;H04B1/04;H03F1/32 主分类号 H04K1/02
代理机构 Cantor Colburn LLP 代理人 Cantor Colburn LLP
主权项 1. A method for compensating nonlinear distortion of an electronic component intended to produce an output signal linearly dependent on a signal to be converted, comprising: a) predistorting at least part of an input signal upstream of the electronic component to generate a predistorted signal based on predistortion parameters to compensate a nonlinear distortion of the electronic component; b) converting, in the electronic component, the predistorted signal; and c) determining the predistortion parameters, the determining of the predistortion parameters comprising: c1) applying a bifrequency test signal to the electronic component, said test signal comprising a first input signal component at a first frequency and a second input signal component at a second frequency, the level of the second input signal component being at least 10 dB lower than the level of the first input signal component, to obtain, at the output of the electronic component, the output signal comprising a first output signal component at said first frequency, a second output signal component at said second frequency, together with a third output signal component at a third frequency, symmetrical to the second frequency in relation to the first frequency;c2) measuring the relative level of the second output signal component and the relative level of the third output signal component, these relative levels being measured relative to the level of the first output signal component;c3) calculating a variable indicative of dissimilarity between the spectrum of the bifrequency test signal and the output signal arising from application of the bifrequency test signal to the electronic component, on the basis of said measurements;c4) predistorting the test signal by adjusting the predistortion parameters to minimize said dissimilarity;the adjusted predistortion parameters being applied during said predistortion of the signal.
地址 FR