发明名称 Lens inspection system
摘要 A lens testing system may have a test pattern source that generates a test pattern of light. A lens may have a lens surface that reflects the test pattern of light. A digital camera system may capture an image of the reflected test pattern of light. Computing equipment may perform image processing operations to evaluate the captured image of the reflected test pattern. The test pattern may contain a known pattern of test elements such as a rectangular array of spots or test elements of other configurations. During image processing operations, the computing equipment may analyze the reflected version of the spots or other test elements to measure characteristics of the lens such as radius of curvature, whether the lens contains flat regions, pits, or bumps, lens placement in a support structure, and other lens performance data. The computing equipment may compare the measured lens data to predetermined criteria.
申请公布号 US8976250(B2) 申请公布日期 2015.03.10
申请号 US201213597704 申请日期 2012.08.29
申请人 Apple Inc. 发明人 Armstrong-Muntner Joel S.;Dudley James J.;Ruh Richard;Rai Anant
分类号 H04N17/00;G01M11/02;G01M11/00 主分类号 H04N17/00
代理机构 Treyz Law Group 代理人 Treyz Law Group ;Treyz G. Victor;Woodruff Kendall P.
主权项 1. A method of evaluating a lens having a lens surface, comprising: applying a temporary reflective coating to the lens; with a test pattern source, generating a test pattern of light that reflects off of the temporary reflective coating; with a camera system, capturing an image of the reflected test pattern; with computing equipment, evaluating the lens by processing the captured image of the reflected test pattern; and after capturing the image of the reflected test pattern, removing the temporary reflective coating from the lens.
地址 Cupertino CA US