发明名称 APPARATUS FOR ANALYZING CONTAMINANTS IN AIR
摘要 <p>The present invention relates to a contaminant analyzing apparatus. More specifically, the present invention is manufactured in the same form as transfer enclosures or transfer cassettes of a tracked automatic transfer apparatus which transfers a semiconductor wafer used on a semiconductor manufacturing line, or a display glass on a display panel manufacturing line. The contaminant analyzing apparatus can measure and analyze contaminants of many areas in real time on the semiconductor manufacturing line or the display panel manufacturing line using an existing apparatus since an analysis element, which analyzes air gathered in a process transferred by the tracked automatic transfer apparatus in real time, is installed inside a main body.</p>
申请公布号 KR101499691(B1) 申请公布日期 2015.03.09
申请号 KR20140057657 申请日期 2014.05.14
申请人 WITHTECH INC. 发明人 YOO, SEOUNG KYO;HWANG, TAE JIN;NOH, TAE YONG;CHA, YUN CHANG
分类号 G01N21/25;G01N1/24;H01L21/02;H01L21/66;H01L21/67 主分类号 G01N21/25
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