发明名称 |
NONPLANAR III-N TRANSISTORS WITH COMPOSITIONALLY GRADED SEMICONDUCTOR CHANNELS |
摘要 |
A III-N semiconductor channel is compositionally graded between a transition layer and a III-N polarization layer. In embodiments, a gate stack is deposited over sidewalls of a fin including the graded III-N semiconductor channel allowing for formation of a transport channel in the III-N semiconductor channel adjacent to at least both sidewall surfaces in response to a gate bias voltage. In embodiments, a gate stack is deposited completely around a nanowire including a III-N semiconductor channel compositionally graded to enable formation of a transport channel in the III-N semiconductor channel adjacent to both the polarization layer and the transition layer in response to a gate bias voltage. |
申请公布号 |
US2015064859(A1) |
申请公布日期 |
2015.03.05 |
申请号 |
US201414535240 |
申请日期 |
2014.11.06 |
申请人 |
lntel Corporation |
发明人 |
THEN Han Wui;DASGUPTA Sansaptak;RADOSAVLJEVIC Marko;CHU-KUNG Benjamin;SUNG Seung Hoon;GARDNER Sanaz K.;CHAU Robert S. |
分类号 |
H01L29/66;H01L29/20;H01L29/772 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of forming a III-N field effect transistor (FET), the method comprising:
forming a crystalline wide band gap transition layer over a substrate; epitaxially growing a III-N semiconductor channel layer over the transition layer, wherein the growing comprises grading the composition of the III-N semiconductor channel layer over a thickness of the channel layer toward a narrower band gap composition proximate the polarization layer; epitaxially growing a wide band gap polarization layer over the III-N semiconductor channel layer; and forming a gate stack over surfaces of the III-N semiconductor channel layer between the transition layer and the polarization layer. |
地址 |
Santa Clara CA US |