| 发明名称 |
FUSE INFORMATION STORAGE CIRCUIT OF SEMICONDUCTOR APPARATUS |
| 摘要 |
A test mode decoder configured to decode a test mode signal inputted a plurality of times and to generate preliminary fuse information, a count latch configured to count the preliminary fuse information in response to a count clock signal and to generate fuse information, and a fuse array block configured to store the fuse information can be included. |
| 申请公布号 |
US2015062997(A1) |
申请公布日期 |
2015.03.05 |
| 申请号 |
US201314100168 |
申请日期 |
2013.12.09 |
| 申请人 |
SK hynix Inc. |
发明人 |
BAEK Chang Ki |
| 分类号 |
G11C17/16;G11C29/00 |
主分类号 |
G11C17/16 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A fuse information storage circuit of a semiconductor apparatus, comprising:
a test mode decoder configured to decode a test mode signal inputted a plurality of times, and to generate preliminary fuse information; a count latch configured to count the preliminary fuse information in response to a count clock signal, and to generate fuse information; and a fuse array block configured to store the fuse information. |
| 地址 |
Icheon-si KR |
