发明名称 CHARGED PARTICLE BEAM DEVICE
摘要 A charged particle beam device that appropriately maintains a throughput of the device for each of specimens different in a gas emission volume from each other is provided. A scanning electron microscope includes an electron source, a specimen stage, a specimen chamber, and an exchange chamber, and further includes a vacuum gauge that measures an internal pressure of the exchange chamber, a time counting unit that counts time taken when a measurement result by the vacuum gauge has reached a predetermined degree of vacuum, and an integral control unit that performs comparative calculation and determination based on a measurement result by the time counting unit and integral control based on a process flow. And, the integral control unit controls changing of a content of a subsequent process based on a shift of the degree of vacuum of the exchange chamber (for example, based on vacuum exhaust time in the exchange chamber when the specimen is in the exchange chamber or a variation of the degree of vacuum of the exchange chamber for a predetermined time interval when the specimen is in the exchange chamber).
申请公布号 US2015060694(A1) 申请公布日期 2015.03.05
申请号 US201314379694 申请日期 2013.02.20
申请人 HITACHI HIGH-TECHNOLOGIES CORPORATION 发明人 Gunji Kazuhiro;Ebizuka Yasushi;Asaga Yuta
分类号 H01J37/18;H01J37/28 主分类号 H01J37/18
代理机构 代理人
主权项 1. A charged particle beam device comprising: a charged particle source; a specimen stage for holding a specimen to be irradiated with a charged particle beam emitted from the charged particle source; a specimen chamber that turns an atmosphere in which the specimen held by the specimen stage is placed into a vacuum state; a specimen exchange chamber that turns an atmosphere of the specimen to be guided into the specimen chamber into a vacuum state; a vacuum gauge that measures an internal pressure of the specimen exchange chamber; a time measuring unit that measures time taken until a measured result by the vacuum gauge reaches a predetermined degree of vacuum; and an integral control unit that performs comparative calculation and determination based on a measurement result from the time measuring unit and integral control based on a process flow, wherein the integral control unit controls to change a content of a subsequent process based on a shift of the degree of vacuum of the specimen exchange chamber.
地址 Tokyo JP