发明名称 |
METHOD FOR MANUFACTURING INSULATED-GATE BIPOLAR TRANSISTOR |
摘要 |
<p>A method for manufacturing an insulated-gate bipolar transistor comprises: providing a first conductive-type semiconductor chip, the semiconductor chip comprising a first surface and a second surface opposite the first surface, and injecting impurities on the first surface to form a first conductive-type or second conductive-type conductive layer; forming grooves at an interval on a surface of the first conductive-type or second conductive-type conductive layer; filling a second conductive-type or first conductive-type semiconductor material inside the grooves to form channels, the channels and the conductive layer being arranged at an interval and in an alternating manner; forming an oxidation layer on the conductive layer and channels; bonding a substrate semiconductor chip on the oxidation layer; thinning the semiconductor chip from the second surface, the thinned first conductive-type semiconductor chip serving as a drift region; forming a front-side structure of an insulated-gate bipolar transistor based on the drift region; removing the substrate semiconductor chip; and removing the oxidation layer; forming a back metal electrode on the channels and the conductive layer, the back metal electrode being electrically connected to the channels and the conductive layer.</p> |
申请公布号 |
WO2015027920(A1) |
申请公布日期 |
2015.03.05 |
申请号 |
WO2014CN85301 |
申请日期 |
2014.08.27 |
申请人 |
CSMC TECHNOLOGIES FAB1 CO., LTD. |
发明人 |
HUANG, XUAN;WANG, WANLI;WANG, GENYI |
分类号 |
H01L29/739 |
主分类号 |
H01L29/739 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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