| 发明名称 |
METHOD AND APPARATUS FOR DETECTING DEFECT OF BACKLIGHT MODULE |
| 摘要 |
According to embodiments of the invention, there are disclosed a method and an apparatus for detecting defect of a backlight module. Images that show components in the backlight module are acquired with a plurality of preset angles relative to a surface of the backlight module. The acquired images that show the components in the backlight module are analyzed, so as to determine whether a defect presents in the components in the backlight module. |
| 申请公布号 |
US2015063675(A1) |
申请公布日期 |
2015.03.05 |
| 申请号 |
US201314346868 |
申请日期 |
2013.05.31 |
| 申请人 |
BOE OPTICAL SCIENCE AND TECHNOLOGY CO., LTD. |
发明人 |
Yan David |
| 分类号 |
G06T7/00;G09G3/34 |
主分类号 |
G06T7/00 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A detection method for detecting defect of a backlight module, comprising:
acquiring images that show components in the backlight module with a plurality of preset angles relative to a surface of the backlight module; and analyzing the acquired images that show the components in the backlight module, so as to determine whether a defect presents in the components in the backlight module. |
| 地址 |
Suzhou, Jiangsu CN |
