发明名称 NONDESTRUCTIVE INSPECTION APPARATUS AND INSPECTION SYSTEM OF STRUCTURE
摘要 A nondestructive inspection apparatus of a structure includes: an inspection apparatus body 1 provided with an infrared light irradiation unit irradiating a structure 3 to be inspected with heating infrared light, a temperature variation measuring unit measuring a variation in temperature of the structure due to the irradiation with infrared light from the infrared light irradiation unit, a drive-control-and-accumulation unit performing drive control of the infrared light irradiation unit and the temperature variation measuring unit and performing data accumulation; and a self-running mechanism unit 2 enabling the inspection apparatus body 1 to move along the structure 3. The structure 3 is inspected for an internal defect by irradiating the structure 3 with heating infrared light while the apparatus moves along the structure 3 through the use of the self-running mechanism unit 2 and measuring the variation in temperature of the structure 3 due to the irradiation with infrared light.
申请公布号 US2015063410(A1) 申请公布日期 2015.03.05
申请号 US201414475327 申请日期 2014.09.02
申请人 V TECHNOLOGY CO., LTD. 发明人 KAJIYAMA Koichi;MIZUMURA Michinobu;OGAWA Yoshinori
分类号 G01N25/72;G01J5/02;G01J5/08 主分类号 G01N25/72
代理机构 代理人
主权项 1. A nondestructive inspection apparatus of a structure, comprising: an infrared light irradiation unit that irradiates a structure to be inspected with heating infrared light; a temperature variation measuring unit that measures a variation in temperature of the structure due to the irradiation with infrared light from the infrared light irradiation unit; a drive-control-and-accumulation unit that performs drive control of the infrared light irradiation unit and the temperature variation measuring unit and performs data accumulation; and a self-running mechanism unit that enables a casing, on which the infrared light irradiation unit, the temperature variation measuring unit, and the drive-control-and-accumulation unit are mounted, to move along the structure, wherein the structure is inspected for an internal defect by irradiating the structure with heating infrared light while the nondestructive inspection apparatus moves along the structure to be inspected through the use of the self-running mechanism unit and measuring the variation in temperature of the structure due to the irradiation with infrared light.
地址 Yokohama-shi JP