发明名称 Systems and Methods for Adjusting Target Manufacturing Parameters on an Absorbent Product Converting Line
摘要 Systems and processes herein may be configured to correlate manufacturing parameters and performance feedback parameters with individual absorbent articles manufactured by a converting apparatus. Embodiments of the systems herein may include inspection sensors configured to inspect substrates and/or component parts advancing along the converting line and communicate inspection parameters to a controller and historian. The systems may also include process sensors configured to monitor equipment on the converting line and communicate process parameters to the controller and historian. The systems herein may also be adapted to receive performance feedback parameters based on the packaged absorbent articles. The systems may correlate inspection parameters, process parameters, and/or performance feedback parameters with individual absorbent articles produced on the converting line. The controller may also be configured to perform various functions based on the performance feedback parameters.
申请公布号 US2015066187(A1) 申请公布日期 2015.03.05
申请号 US201414474554 申请日期 2014.09.02
申请人 The Procter & Gamble Company 发明人 Berg Eric Christopher;Cedrone Louis J.;Kent Jeffrey Michael;Von Den Steinen Helen Louise;Lightcap William Lawrence;Royce Daniel
分类号 G05B13/02;G05B19/418 主分类号 G05B13/02
代理机构 代理人
主权项 1. A method for manufacture absorbent products, the method comprising the steps of: providing a communication network; connecting a first sensor with the communication network; connecting a second sensor with the communication network; connecting a controller with the communication network; advancing a substrate in a machine direction through a converting apparatus; virtually segmenting the substrate into a plurality of virtual products along the machine direction; sequentially adding component parts to the substrate; inspecting the substrate and component parts with the first sensor; communicating inspection parameters from the first sensor to the controller; comparing the inspection parameter with a target inspection parameter; inspecting a process with the second sensor; communicating process parameters from the second sensor to the controller; comparing the process parameters with a target process parameter; cutting the substrate with component parts added thereto into discrete absorbent articles; packaging the discrete absorbent articles; receiving performance feedback parameters based on the packaged absorbent articles; correlating at least one inspection parameter with a selected packaged absorbent article; correlating at least one process parameter with the selected packaged absorbent article; correlating at least one performance feedback parameter with the selected packaged absorbent article; and adjusting at least one target inspection parameter or at least one the target process parameter based on the performance feedback parameter.
地址 Cincinnati OH US