| 发明名称 |
TEST CARRIER, DEFECT DETERMINATION APPARATUS, AND DEFECT DETERMINATION METHOD |
| 摘要 |
A test carrier that temporarily accommodates a die includes: a first wiring pattern that electrically connects an external terminal of the test carrier and a TSV of the die; and a second wiring pattern that electrically connects the TSVs. |
| 申请公布号 |
US2015061717(A1) |
申请公布日期 |
2015.03.05 |
| 申请号 |
US201314390607 |
申请日期 |
2013.05.21 |
| 申请人 |
ADVANTEST CORPORATION |
发明人 |
Nakamura Kiyoto |
| 分类号 |
G01R31/28;G01R1/04 |
主分类号 |
G01R31/28 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A test carrier that temporarily accommodates an electronic device, comprising:
a first wiring pattern that electrically connects an external terminal of the test carrier and one of electrodes which the electronic device has; and a second wiring pattern that electrically connects at least two of the electrodes. |
| 地址 |
Tokyo JP |
