发明名称 ANTI-COUNTERFEITING OPTO-THERMAL WATERMARK FOR ELECTRONICS
摘要 An anti-counterfeiting technique presents, to a test thermoreflective mark at a first temperature, a first electromagnetic wave. A first test reflective profile for the test thermoreflective mark associated with the first temperature is recorded. A second electromagnetic wave is presented to the test thermoreflective mark at a second temperature. A second test reflective profile for the test thermoreflective mark associated with the second temperature is recorded. The first test reflective profile is compared with a first control reflective profile that is associated with a genuine thermoreflective mark. The second test reflective profile is compared with a second control reflective profile that is associated with the genuine thermoreflective mark.
申请公布号 US2015061279(A1) 申请公布日期 2015.03.05
申请号 US201314102664 申请日期 2013.12.11
申请人 International Business Machines Corporation 发明人 Cruz Ethan E.;Harper Michael W.;Kruse Ryan M.;Moore Arden L.;Veraa Brian G.
分类号 B42D25/20;B42D25/36 主分类号 B42D25/20
代理机构 代理人
主权项 1. A method for authenticating an item having a thermoreflective mark, the method comprising: presenting, to the thermoreflective mark at a first temperature, a first electromagnetic wave, wherein the thermoreflective mark has a pattern and a temperature sensitive coating; recording a first reflective profile produced from said presenting the first electromagnetic wave to the thermoreflective mark at the first temperature; presenting, to the thermoreflective mark at a second temperature, a second electromagnetic wave; recording a second reflective profile produced from said presenting the second electromagnetic wave to the thermoreflective mark at the second temperature; and validating the thermoreflective mark based, at least in part, on the first reflective profile and the second reflective profile, wherein said validating the thermoreflective mark is against control data that are based on a control thermoreflective mark.
地址 Armonk NY US