METHOD FOR DETERMINING GRAPHENE THICKNESS USING ATOMIC FORCE MICROSCOPE

摘要

The present invention relates to a method for precisely determining graphene thickness using an atomic force microscope (AFM), comprising: a first step of rotating graphene samples at a predetermined angle, measuring a friction force by using the atomic force microscope, and determining a direction of a ripple; and a second step of measuring thickness by using the atomic force microscope in a contact mode to be perpendicular to the direction of the ripple of graphene. The precise thickness of the graphene can be measured by using the atomic force microscope at room temperature or high pressure without the need of extreme environmental conditions such as a high temperature and high vacuum.