发明名称 ION DEFLECTION IN TIME-OF-FLIGHT MASS SPECTROMETRY
摘要 A time-of-flight mass spectrometry (TOF MS) system includes an ion deflector, ion extractor, a flight tube, and a detector. The deflector may be disposed in the flight tube or outside the flight tube upstream of the extractor. The deflector deflects ions away from a main flight path such that the defected ions are not detected.
申请公布号 US2015060656(A1) 申请公布日期 2015.03.05
申请号 US201314015694 申请日期 2013.08.30
申请人 Agilent Technologies, Inc. 发明人 Ugarov Michael
分类号 H01J49/06;H01J49/40 主分类号 H01J49/06
代理机构 代理人
主权项 1. A method for controlling ions in a time-of-flight mass spectrometer (TOF MS), the method comprising: transmitting ions to an extractor; extracting at least some of the ions transmitted to the extractor into a flight tube as a plurality of successive ion packets, by applying an extraction voltage to the extractor; deflecting at least some of the ions by applying a deflection voltage to a deflector; and timing the application of the deflection voltage relative to the application of the extraction voltage such that ions from one or more entire ion packets of are deflected and prevented from reaching a detector and the non-deflected ions travel through the flight tube to the detector.
地址 Loveland CO US