AUTOMATIC RETEST METHOD FOR SYSTEM-LEVEL IC TEST EQUIPMENT AND IC TEST EQUIPMENT USING SAME

摘要

An automatic retest method for a system-level IC test equipment and the IC test equipment is disclosed, wherein the IC test equipment includes multiple testing units, a loading/unloading unit, and a processing unit; each testing unit is capable of testing an IC individually and has a pass rate. When the testing unit finishes a test operation, it will send test report of the IC to the processing unit. The processing unit will determine whether the IC has reached a pass threshold of the testing unit. The processing unit will issue a command, according to a predetermined rule, to transfer the IC that failed to reach the pass threshold to one of the testing units conforming to the predetermined rule to conduct a retest operation. Finally, the processing unit will confirm whether the IC that failed to reach the pass threshold has reached the pass threshold in the retest operation.

主权项

1. A method of testing IC chips for a system-level IC test equipment that includes a processing unit, a loading/unloading unit, and multiple testing units adapted for testing the IC chips independently, wherein each of the testing units provides a pass rate for IC chips, the method comprising the steps of:
(a) using the testing units to test the IC chips individually and transmitting a test result of the IC chips to the processing unit; (b) using the processing unit to assess whether the respective IC chips have reached pass thresholds of the respective testing units, according to the test result; (c) according to a predetermined rule and under control of the processing unit, transferring the IC that failed to reach the pass threshold to one of the multiple testing units that conforms to the predetermined rule to conduct a retest operation, wherein the predetermined rule is set based on the pass rates of the multiple testing units; and (d) assessing whether the IC that failed to reach the pass threshold in step (b) has reached the pass threshold in the retest operation.