发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 The semiconductor device includes a semiconductor substrate having a first active area defined by a first isolation layer; a gate insulating layer formed on the semiconductor substrate; a first conductive layer formed on the gate insulating layer; a dielectric layer formed on the first conductive layer; at least one first contact hole passing through the dielectric layer; a second conductive layer, formed on the dielectric layer, the second conductive layer filling the at least one first contact hole to contact the first conductive layer; and at least one first contact plug connected to the second conductive layer in the first active area, wherein the at least one first contact plug is offset from the at least one first contact hole to overlap the dielectric layer.
申请公布号 US2015064894(A1) 申请公布日期 2015.03.05
申请号 US201414542197 申请日期 2014.11.14
申请人 SK hynix Inc. 发明人 KOO Min Gyu
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项
地址 Gyeonggi-do KR