发明名称 |
SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME |
摘要 |
The present technology includes a semiconductor memory device, including a channel layer and interlayer insulation layers surrounding the channel layer. The interlayer insulation layers are stacked with a trench interposed therebetween. A seed pattern is formed on a surface of the trench and a metal layer is formed on the seed pattern in the trench. |
申请公布号 |
US2015064866(A1) |
申请公布日期 |
2015.03.05 |
申请号 |
US201414536276 |
申请日期 |
2014.11.07 |
申请人 |
SK hynix Inc. |
发明人 |
KWAK Sang Hyon |
分类号 |
H01L29/66;H01L21/285;H01L27/115 |
主分类号 |
H01L29/66 |
代理机构 |
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代理人 |
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主权项 |
1. A method of manufacturing a semiconductor memory device, the method comprising:
forming interlayer insulation layers surrounding a channel layer, wherein the interlayer insulation layers are stacked with a trench interposed therebetween; forming a seed film on a surface of the trench and on surfaces of the interlayer insulation layers; forming a sacrificial pattern in the trench; forming a seed pattern in the trench by etching the seed film by using the sacrificial pattern as an etching barrier; and growing a metal layer from the seed pattern in the trench. |
地址 |
Gyeonggi-do KR |