发明名称 SEMICONDUCTOR MEMORY DEVICE AND METHOD OF MANUFACTURING THE SAME
摘要 The present technology includes a semiconductor memory device, including a channel layer and interlayer insulation layers surrounding the channel layer. The interlayer insulation layers are stacked with a trench interposed therebetween. A seed pattern is formed on a surface of the trench and a metal layer is formed on the seed pattern in the trench.
申请公布号 US2015064866(A1) 申请公布日期 2015.03.05
申请号 US201414536276 申请日期 2014.11.07
申请人 SK hynix Inc. 发明人 KWAK Sang Hyon
分类号 H01L29/66;H01L21/285;H01L27/115 主分类号 H01L29/66
代理机构 代理人
主权项 1. A method of manufacturing a semiconductor memory device, the method comprising: forming interlayer insulation layers surrounding a channel layer, wherein the interlayer insulation layers are stacked with a trench interposed therebetween; forming a seed film on a surface of the trench and on surfaces of the interlayer insulation layers; forming a sacrificial pattern in the trench; forming a seed pattern in the trench by etching the seed film by using the sacrificial pattern as an etching barrier; and growing a metal layer from the seed pattern in the trench.
地址 Gyeonggi-do KR