METHOD FOR TESTING DATA PACKET SIGNAL TRANSCEIVERS USING INTERLEAVED DEVICE SETUP AND TESTING

摘要

A method of using tester data packet signals and control instructions for testing multiple data packet signal transceiver devices under test (DUTs). During mutually alternating time intervals, selected ones of which are substantially contemporaneous, multiple tester data packet signals and DUT control instructions are used for concurrent testing of multiple DUTs.

主权项

1. A method of using tester data packet signals and control instructions for testing multiple data packet signal transceiver devices under test (DUTs), comprising:
receiving, with each one of first one or more of a plurality of DUTs during one of a first plurality of tester signal intervals, a respective one of a plurality of tester data packet signals; receiving, with each one of second one or more of said plurality of DUTs during one of a second plurality of tester signal intervals, a respective one of said plurality of tester data packet signals; executing, with each one of said first one or more of said plurality of DUTs during one of a first plurality of instruction intervals, a plurality of DUT control instructions to configure each one of said first one or more of said plurality of DUTs to receive a respective one of said plurality of tester data packet signals; and executing, with each one of said second one or more of said plurality of DUTs during one of a second plurality of instruction intervals, a plurality of DUT control instructions to configure each one of said second one or more of said plurality of DUTs to receive a respective one of said plurality of tester data packet signals; wherein
respective ones of said first plurality of tester signal intervals and said first plurality of instruction intervals are mutually alternating,respective ones of said second plurality of tester signal intervals and said second plurality of instruction intervals are mutually alternating,respective ones of said first plurality of tester signal intervals are substantially contemporaneous with respective ones of said second plurality of instruction intervals, andrespective ones of said second plurality of tester signal intervals are substantially contemporaneous with respective ones of said first plurality of instruction intervals.