发明名称 ANTI-ROTATION FOR WIRE PROBES IN A PROBE HEAD OF A DIE TESTER
摘要 Wire probes are described that resist rotation during assembly into a probe head of a die tester. One example includes probe wires with a protrusion at a pre-determined position along the length of the wire. A probe substrate with pads on one side each to attach to and electrically connect with a probe wire and a pads on the opposite side to connect to test equipment and a probe holder above the substrate with holes. Each hole holds a respective one of the probe wires against the probe substrate. Each hole also has a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire.
申请公布号 US2015061713(A1) 申请公布日期 2015.03.05
申请号 US201314013422 申请日期 2013.08.29
申请人 Shia David;Albertson Todd P.;Mortin Keith J. 发明人 Shia David;Albertson Todd P.;Mortin Keith J.
分类号 G01R1/067;G01R3/00 主分类号 G01R1/067
代理机构 代理人
主权项 1. An apparatus comprising: a plurality of probe wires, each wire having a protrusion at a pre-determined position along the length of the wire; a probe substrate having a plurality of pads on one side each to attach to and electrically connect with a probe wire and a plurality of plurality of pads on the opposite side to connect to test equipment; and a probe holder above the substrate having a plurality of holes, each hole to hold a respective one of the plurality of probe wires against the probe substrate, each hole also having a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire.
地址 Hillsboro OR US