发明名称 |
ANTI-ROTATION FOR WIRE PROBES IN A PROBE HEAD OF A DIE TESTER |
摘要 |
Wire probes are described that resist rotation during assembly into a probe head of a die tester. One example includes probe wires with a protrusion at a pre-determined position along the length of the wire. A probe substrate with pads on one side each to attach to and electrically connect with a probe wire and a pads on the opposite side to connect to test equipment and a probe holder above the substrate with holes. Each hole holds a respective one of the probe wires against the probe substrate. Each hole also has a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire. |
申请公布号 |
US2015061713(A1) |
申请公布日期 |
2015.03.05 |
申请号 |
US201314013422 |
申请日期 |
2013.08.29 |
申请人 |
Shia David;Albertson Todd P.;Mortin Keith J. |
发明人 |
Shia David;Albertson Todd P.;Mortin Keith J. |
分类号 |
G01R1/067;G01R3/00 |
主分类号 |
G01R1/067 |
代理机构 |
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代理人 |
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主权项 |
1. An apparatus comprising:
a plurality of probe wires, each wire having a protrusion at a pre-determined position along the length of the wire; a probe substrate having a plurality of pads on one side each to attach to and electrically connect with a probe wire and a plurality of plurality of pads on the opposite side to connect to test equipment; and a probe holder above the substrate having a plurality of holes, each hole to hold a respective one of the plurality of probe wires against the probe substrate, each hole also having a key to mate with a protrusion of a respective probe wire so that the protrusions engage the keys to prevent rotation of the respective wire. |
地址 |
Hillsboro OR US |