发明名称 NON-VOLATILE STORAGE DEVICE AND MANUFACTURING METHOD THEREOF
摘要 According to an embodiment, a solid state storage device includes a first gate; a plurality of conductive layers having insulating layers therebetween, one of the insulating layers located on the first gate, an interconnection region extending inwardly of the first gate, a first semiconductor layer extending through the plurality of conductive layers and insulating layers, a second semiconductor layer extending through the plurality of conductive layers and insulating layers; a third semiconductor layer extending through the interconnection region and electrically connecting the first and second semiconductor layers, and an insulator extending through the plurality of conductive layers and insulating layers at a location intermediate of the first and second semiconductor layers, and also extending inwardly of the interconnection region.
申请公布号 US2015060976(A1) 申请公布日期 2015.03.05
申请号 US201414194779 申请日期 2014.03.02
申请人 Kabushiki Kaisha Toshiba 发明人 IGUCHI Tadashi
分类号 H01L27/115 主分类号 H01L27/115
代理机构 代理人
主权项 1. A solid state storage device, comprising: a first gate; a plurality of conductive layers having insulating layers therebetween, one of the insulating layers located on the first gate; an interconnection region extending inwardly of the first gate; a first semiconductor layer extending through the plurality of conductive layers and insulating layers; a second semiconductor layer extending through the plurality of conductive layers and insulating layers; a third semiconductor layer extending through the interconnection region and electrically connecting the first and second semiconductor layers; and an insulator extending through the plurality of conductive layers and insulating layers at a location intermediate of the first and second semiconductor layers, and also extending inwardly of the interconnection region.
地址 Tokyo JP