发明名称 FABRICATION OF NICKEL FREE SILICIDE FOR SEMICONDUCTOR CONTACT METALLIZATION
摘要 A semiconductor device with an n-type transistor and a p-type transistor having an active region is provided. The active region further includes two adjacent gate structures. A portion of a dielectric layer between the two adjacent gate structures is selectively removed to form a contact opening having a bottom and sidewalls over the active region. A bilayer liner is selectively provided within the contact opening in the n-type transistor and a monolayer liner is provided within the contact opening in the p-type transistor. The contact opening in the n-type transistor and p-type transistor is filled with contact material. The monolayer liner is treated to form a silicide lacking nickel in the p-type transistor.
申请公布号 US2015061032(A1) 申请公布日期 2015.03.05
申请号 US201414536737 申请日期 2014.11.10
申请人 GLOBALFOUNDRIES INC. 发明人 DENIZ Derya
分类号 H01L29/51;H01L29/78 主分类号 H01L29/51
代理机构 代理人
主权项
地址 GRAND CAYMAN KY