| 发明名称 |
SEMICONDUCTOR APPARATUS AND TEST METHOD |
| 摘要 |
A test driver selection unit configured to enable a plurality of test driver selection signals in response to a test pulse and a test clock, and a plurality of drivers configured to receive the plurality of test driver selection signals, wherein each of the plurality of drivers is configured to output an output signal to a data bump in response to a test driver selection signal, data, and an output enable signal, and to receive a first driving voltage and a second driving voltage. |
| 申请公布号 |
US2015061710(A1) |
申请公布日期 |
2015.03.05 |
| 申请号 |
US201314140372 |
申请日期 |
2013.12.24 |
| 申请人 |
SK hynix Inc. |
发明人 |
LEE Dong Uk |
| 分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
| 代理机构 |
|
代理人 |
|
| 主权项 |
1. A semiconductor apparatus comprising:
a test driver selection unit configured to enable a plurality of test driver selection signals in response to a test pulse and a test clock; and a plurality of drivers configured to receive the plurality of test driver selection signals, wherein each of the plurality of drivers is configured to output an output signal to a data bump in response to a test driver selection signal, data, and an output enable signal, and to receive a first driving voltage and a second driving voltage. |
| 地址 |
Icheon-si Gyeonggi-do KR |
