发明名称 |
Nitride-based transistors and methods of fabricating the same |
摘要 |
<p>A method of fabricating a nitride-based transistor is provided. The method includes sequentially forming a first nitride-based semiconductor layer doped with first type dopants, a second nitride-based semiconductor layer doped with second type dopants, and a third nitride-based semiconductor layer doped with the first type dopants on a substrate. A first trench is formed to penetrate the third and second nitride-based semiconductor layers and to extend into the first nitride-based semiconductor layer. A fourth nitride-based semiconductor layer doped with the first type dopants is formed to fill the first trench. A second trench is formed in the fourth nitride-based semiconductor layer. A gate electrode is formed in the second trench. A source electrode is formed to be electrically connected to at least one of the third and fourth nitride-based semiconductor layers, and a drain electrode is formed to be electrically connected to the first nitride-based semiconductor layer.</p> |
申请公布号 |
EP2843708(A1) |
申请公布日期 |
2015.03.04 |
申请号 |
EP20140182215 |
申请日期 |
2014.08.26 |
申请人 |
SEOUL SEMICONDUCTOR CO., LTD. |
发明人 |
TAKEYA, MOTONOBU;LEE, KWAN HYUN;KIM, EUN HEE |
分类号 |
H01L29/78;H01L29/66 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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