Analysis method for X-ray diffraction measurement data

摘要

Peak positions and integrated intensities of diffraction X-ray are determined on the basis of X-ray diffraction measurement data output from an X-ray diffractometer, the number of determined peaks of the diffraction X-ray is counted, and analysis processing is started when the counted number of peaks reaches a preset peak number. The analysis processing is repetitively executed on the basis of X-ray diffraction measurement data. The peak positions and the integrated intensities of the diffraction X-ray are determined from the X-ray diffraction measurement data obtained from the start of the measurement till the analysis processing concerned, and qualitative analysis of collating the determined peak positions and integrated intensities with standard peak card data whose data base is made in advance and searching materials contained in a measurement sample, and quantitative analysis of determining the quantities of the materials contained in the measurement sample are executed.

主权项

1. An analysis method for X-ray diffraction measurement data, comprising the steps of:
repetitively executing analysis of X-ray diffraction measurement data output from an X-ray diffractometer on the basis of the X-ray diffraction measurement data in parallel to X-ray diffraction measurement based on the X-ray diffractometer; determining peak positions and integrated intensities of diffraction peaks on the basis of the X-ray diffraction measurement data output from the X-ray diffractometer; and counting the number of determined diffraction peaks is counted, the analysis of the X-ray diffraction measurement data being started when the counted peak number reaches a preset peak number.