发明名称 |
Vertical GaN JFET with low gate-drain capacitance and high gate-source capacitance |
摘要 |
An embodiment of a vertical power device includes a III-nitride substrate, a drift region coupled to the III-nitride substrate and comprising a III-nitride material of a first conductivity type, and a channel region coupled to the drift region and comprising a III-nitride material of the first conductivity type. The vertical power device also includes a source region coupled to the channel region and comprising a III-nitride material of the first conductivity type, and a gate region coupled to the channel region. The gate region includes a III-nitride material of a second conductivity type. The vertical power device further includes a source-coupled region coupled to the drift region and electrically connected with the source region. The source-coupled region includes a III-nitride material of the second conductivity type. |
申请公布号 |
US8969926(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201213675694 |
申请日期 |
2012.11.13 |
申请人 |
Avogy, Inc. |
发明人 |
Disney Donald R. |
分类号 |
H01L27/085;H01L21/04 |
主分类号 |
H01L27/085 |
代理机构 |
Kilpatrick Townsend & Stockton LLP |
代理人 |
Kilpatrick Townsend & Stockton LLP |
主权项 |
1. A vertical power device comprising:
a III-nitride substrate; a III-nitride drift region coupled to the III-nitride substrate and having a first conductivity type; a III-nitride channel region coupled to the III-nitride drift region and having the first conductivity type; a III-nitride source region coupled to the III-nitride channel region and having the first conductivity type; a III-nitride gate region coupled to the III-nitride channel region, wherein the III-nitride gate region has a second conductivity type; and a source-coupled region coupled to the III-nitride drift region and electrically connected with the III-nitride source region, wherein the source-coupled region comprises a III-nitride material of the second conductivity type. |
地址 |
San Jose CA US |