发明名称 |
Field-effect transistor (FET) with source-drain contact over gate spacer |
摘要 |
A field-effect transistor (FET) and methods for fabricating such. The FET includes a substrate having a crystalline orientation, a source region in the substrate, and a drain region in the substrate. Gate spacers are positioned over the source region and the drain region. The gate spacers include a gate spacer height. A source contact physically and electrically contacts the source region and extends beyond the gate spacer height. A drain contact physically and electrically contacts the drain region and extends beyond the gate spacer height. The source and drain contacts have the same crystalline orientation as the substrate. |
申请公布号 |
US8969152(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201313920044 |
申请日期 |
2013.06.17 |
申请人 |
International Business Machines Corporation |
发明人 |
Chan Kevin K.;Haensch Wilfried E.;Leobandung Effendi;Yang Min |
分类号 |
H01L21/8242;H01L29/66 |
主分类号 |
H01L21/8242 |
代理机构 |
|
代理人 |
Tuchman Ido;Percello Louis J. |
主权项 |
1. A method for constructing a field-effect transistor (FET), the method comprising:
forming a source region and a drain region in a substrate; forming gate spacers over the source region and the drain region, the gate spacers including a gate spacer height; epitaxially growing a source contact and a drain contact, the source contact contacting the source region and extending beyond the gate spacer height, the drain contact contacting the drain region and extending beyond the gate spacer height; forming an electrically conductive gate above and intermediate to the source region and the drain region; and wherein the gate is formed after epitaxially growing the source contact and the drain contact. |
地址 |
Armonk NY US |