发明名称 |
Methods for fabricating semiconductor device structures and arrays of vertical transistor devices |
摘要 |
A semiconductor device structure is disclosed. The semiconductor device structure includes a mesa extending above a substrate. The mesa has a channel region between a first side and second side of the mesa. A first gate is on a first side of the mesa, the first gate comprising a first gate insulator and a first gate conductor comprising graphene overlying the first gate insulator. The gate conductor may comprise graphene in one or more monolayers. Also disclosed are a method for fabricating the semiconductor device structure; an array of vertical transistor devices, including semiconductor devices having the structure disclosed; and a method for fabricating the array of vertical transistor devices. |
申请公布号 |
US8969154(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201113215968 |
申请日期 |
2011.08.23 |
申请人 |
Micron Technology, Inc. |
发明人 |
Sandhu Gurtej S. |
分类号 |
H01L29/772;B82Y10/00;H01L29/66;H01L27/105;H01L21/8234;H01L29/78 |
主分类号 |
H01L29/772 |
代理机构 |
TraskBritt |
代理人 |
TraskBritt |
主权项 |
1. A method for fabricating a semiconductor device structure, comprising:
forming a plurality of metal seeds upon a substrate; forming a conductor material upon each of the plurality of metal seeds to form a plurality of gate conductors; forming an insulator material upon each of the plurality of gate conductors to form a plurality of gate insulators, a first gate insulator of the plurality of gate insulators separated from a second gate insulator of the plurality of gate insulators by a first trench; and filling the first trench with a channel material to form a channel region. |
地址 |
Boise ID US |