发明名称 |
Threshold-based temperature-dependent power/thermal management with temperature sensor calibration |
摘要 |
A method and apparatus for temperature sensor calibration is disclosed. In one embodiment, an integrated circuit (IC) is tested at a first known temperature corresponding to a first temperature threshold. During the test, a first temperature reading is obtained from a temperature sensor. A first offset is calculated by determining the difference between the first known temperature and the first temperature reading. The first offset is recorded in a storage unit for later use during operation of the IC. During operation, the first offset may be added to temperature readings obtained from a temperature sensing unit to produce an adjusted temperature value. The adjusted temperature value may be compared to one or more temperature thresholds. Based on the comparisons, a power management unit may perform power control actions. |
申请公布号 |
US8970234(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201113245229 |
申请日期 |
2011.09.26 |
申请人 |
Apple Inc. |
发明人 |
Takayanagi Toshinari;Cho Jung Wook |
分类号 |
G01R31/00;G01K15/00;G01K3/00;G06F1/20;G06F1/32 |
主分类号 |
G01R31/00 |
代理机构 |
Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. |
代理人 |
Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C. ;Heter Erik A. |
主权项 |
1. A method comprising:
performing tests an integrated circuit (IC) at a first specified temperature; reading a first temperature value provided by a temperature sensor during testing during testing at the first temperature; determining a first offset value, wherein the first offset value is a difference between the first specified temperature and the first temperature value; recording the first offset value; repeating the testing for one or more additional specified temperatures including a second specified temperature; reading one or more additional temperature values provided by the temperature sensor, including a second temperature value, during each iteration of said testing; determining one or more corresponding additional offset values, including a second offset value; and recording each of the one or more corresponding additional offset values. |
地址 |
Cupertino CA US |