Panel driving circuit that generates panel test pattern and panel test method thereof

摘要

A panel driving circuit that produces a panel test pattern and a method of testing a panel are provided. The driving circuit includes a pattern generation unit and a selection unit. The pattern generation unit responds to a system clock and produces pattern test data and pattern test signals. The selection unit responds to a test signal and selects and outputs either (a) the pattern test data and the pattern test signals that are outputted from the pattern generation unit, or (b) the pattern test data and pattern test signals that are directly applied from the outside. The driving circuit and the method of the panel test generates the panel test data, the horizontal synchronizing signal, the vertical synchronizing signal, and the data activating signal within the driving circuit using a system clock so that the testing of the panel can be carried out without using a separate test device.

主权项

1. A panel driving circuit comprising:
a pattern generation unit configured to generate pattern test data and pattern test signals, the pattern test data including a plurality of panel test patterns, the pattern generation unit including: a horizontal synchronizing signal generation unit configured to generate a horizontal synchronizing signal; a data activating signal generation unit configured to generate a data activating signal; a vertical synchronizing signal generation unit configured to generate a vertical synchronizing signal; and a pattern decision making unit configured to select one panel test pattern among the plurality of panel test patterns; a selection unit configured to select the pattern test data and the pattern test signals; and a controller configured to output the selected pattern test data and the selected pattern test signals to a panel, wherein the plurality of panel test patterns include a gray pattern, a cross-talk pattern, and a flicker pattern.