Phased array scanning into a curvature

摘要

A system for use in determining a location of a defect in an object is provided. The system includes an ultrasonic phased array configured to provide a sector scan of the object, a display, and a processor. The processor is programmed to provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius, receive gate parameters of a gate used to measure a location of a reflection of a beam emitted from the ultrasonic phased array, wherein the reflection is indicative of a defect on the first surface or the second surface, and calculate a location of the defect using the gate.

主权项

1. A system for use in determining a location of a defect in an object, the system comprising:
an ultrasonic phased array configured to provide a sector scan of the object; a display; and a processor programmed to: provide a volume-corrected view of a sector of an ultrasonic inspection of the object on the display, wherein the object has a first surface defined by a first radius and a second surface defined by a second radius that is shorter than the first radius; receive gate parameters of a gate, comprising a gate start and a gate end, used to measure a location of a reflection, wherein the reflection is indicative of a defect on the first surface or the second surface; and calculate a location of the defect using the gate, by calculating a sound path distance of an ultrasonic beam angle of an ultrasonic beam to the gate start and the gate end for each ultrasonic beam angle in a sector scan; wherein the ultrasonic beam reflects off of the first surface and the second surface.