发明名称 |
Method for forming a buried p-n junction and articles formed thereby |
摘要 |
Methods for forming a buried p-n junction and avalanche photodiodes incorporating same are disclosed. The method includes forming a well in a semiconductor layer, wherein a depth of the well is selected as a function of the desired shape of the p-n junction in the edge region of the avalanche photodiode. A diffusion mask is then formed on the semiconductor layer, wherein the diffusion mask includes at least two openings per APD formed, wherein one opening is a diffusion window and the other is a diffusion sink. The depth of the p-n junction in the active region of the APD is based, in part, on an attribute of the diffusion mask relating to the diffusion sink. |
申请公布号 |
US8969117(B2) |
申请公布日期 |
2015.03.03 |
申请号 |
US201313801560 |
申请日期 |
2013.03.13 |
申请人 |
Princeton Lightwave, Inc. |
发明人 |
Itzler Mark Allen |
分类号 |
H01L21/00;H01L31/09;H01L31/18;H01L31/107 |
主分类号 |
H01L21/00 |
代理机构 |
Kaplan Breyer Schwarz & Ottesen, LLP |
代理人 |
Kaplan Breyer Schwarz & Ottesen, LLP |
主权项 |
1. A method comprising:
forming a well in a semiconductor layer, wherein the well has a depth that, with a single diffusion of dopant, achieves a desired profile for a peripheral portion of a p-n junction; forming a diffusion mask over the semiconductor layer, wherein the diffusion mask comprises a diffusion window and a diffusion sink; and diffusing the dopant into the semiconductor layer through the diffusion mask, thereby forming, in a single diffusion of dopant, the p-n junction having the desired profile of the peripheral portion. |
地址 |
Cranbury NJ US |