发明名称 METHOD FOR ETCHING SILICON OXIDE FILM
摘要 PROBLEM TO BE SOLVED: To provide a method for reducing the bowing of a shape obtained by etching a silicon oxide film.SOLUTION: A method for etching a silicon oxide film includes a step of exposing a workpiece to plasma of process gas to etch a silicon oxide film OX, the workpiece having the silicon oxide film and a mask provided on the silicon oxide film. The mask includes a first film L1 provided on the silicon oxide film OX and a second film L2 provided on the first film. The second film comprises a film that has an etching rate lower than the etching rate of the first film, to an active species in the plasma.
申请公布号 JP2015041624(A) 申请公布日期 2015.03.02
申请号 JP20130170218 申请日期 2013.08.20
申请人 TOKYO ELECTRON LTD 发明人 OGASAWARA MASAHIRO;URAKAWA MICHIFUMI;HAYAKAWA YOSHINOBU;KUBOTA KAZUHIRO;WATANABE HIKARU
分类号 H01L21/3065 主分类号 H01L21/3065
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