| 摘要 |
PROBLEM TO BE SOLVED: To provide a probe pin having high contact stability and inexpensively manufacturable.SOLUTION: A probe pin comprises: a coil spring 3; a first plunger 1 having a main body part 11 and a first elastic piece 12 and a second elastic piece 13 extending in the same direction from the body part 11; and a second plunger 2 press-fitted between the first elastic piece 12 and the second elastic piece 13. The first plunger 1 and the second plunger 2 have electric conductivity, each of the first plunger 1 and the second plunger 2 being inserted from both ends 3A, 3B of the coil spring 3. The second plunger 2 is sandwiched by the first elastic piece 12 and second elastic piece 13 of the first plunger 1, and the first electric piece 12 is press-contacted with one face of the second plunger 2, electrical continuity between the first plunger 1 and the second plunger 2 being established via this press-contacted portion. |
