| 摘要 |
<p>PROBLEM TO BE SOLVED: To provide a three-dimensional shape data acquisition apparatus for acquiring three-dimensional shape data on an object by irradiating the object with measurement light in a preset emission pattern, capable of preventing degradation in measurement accuracy due to interference of an irradiation pattern in a case of irradiating the object with the measurement light from a plurality of positions.SOLUTION: A three-dimensional shape data acquisition apparatus 1 including: a sensor unit 2 that includes a light-emitting unit 2a emitting measurement light in a preset emission pattern, and an imaging unit 2b imaging an object irradiated with the measurement light; and a numerical calculation unit 3 calculating a three-dimensional shape of the object based on output from the sensor unit 2 is provided. The three-dimensional shape data acquisition apparatus 1 includes a plurality of sensor units 2, each sensor unit 2 including: the light-emitting unit 2a emitting the measurement light in an emission pattern different from that of the light-emitting unit 2a of another sensor unit 2; and the imaging unit 2b imaging the object by receiving only reflection light of the measurement light emitted from the light-emitting unit 2a belonging to the same sensor unit 2.</p> |
