| 摘要 |
A method and analyzer for identifying, verifying or otherwise characterizing a sample involves emitting electromagnetic radiation in at least one beam at a sample. The electromagnetic radiation includes at least two different wavelengths. A sample detector detects affected electromagnetic radiation resulting from the emitted electromagnetic radiation affected by the sample and provides output representing the detected affected radiation. A processor determines sample coefficients from the output and identifies, verifies or otherwise characterizes the sample using the sample coefficients and training coefficients determined from training samples. The coefficients reduce sensitivity to a sample retainer variation and/or are independent of concentration. |
