发明名称 OPENING FILL PROCESS AND STRUCTURES FORMED THEREBY
摘要 Disclosed are a method for forming conductive structures and conductive structures. The method for forming the conductive structures comprises steps of: forming an opening in a dielectric layer on a substrate; performing a cleaning process on the dielectric layer having the opening; forming a nucleation layer in the opening; etching the nucleation layer in the opening; and forming a conductive material in the opening and on the nucleation layer after the etching. An upper portion of the opening is distal from the substrate, and a lower portion of the opening is proximate to the substrate. After the etching, an upper portion of the nucleation layer in the upper portion of the opening has a thickness less than that of a lower portion of the nucleation layer in the lower portion of the opening.
申请公布号 KR20150020983(A) 申请公布日期 2015.02.27
申请号 KR20130153795 申请日期 2013.12.11
申请人 发明人
分类号 H01L21/28 主分类号 H01L21/28
代理机构 代理人
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